The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. Extends Highly Parallel Testing Capabilities. Click on more information for further details. 0000003026 00000 n
Designed for highly parallel multi-site and in-site parallel testing, the new #V93000 Wave Scale RF and V93000 Wave Scale MX cards substantially reduce the cost of test and time to market for today's RF #semiconductors while creating a path for testing future 5G devices.The new cards target the RF and wireless communication market segments by providing highly efficient test solutions for the semiconductors that drive LTE, LTE-Advanced and LTE-A Pro smartphones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and #IoT applications. 0000349795 00000 n
With high density cards, universal features and precision force and measurement capabilities the PAC solution enables leading CoT savings at high site count testing. Last modified August 12, 2018, ALamat : Gedung Rektorat Lt.4 Kampus Hijau Bumi Tridharma Anduonohu, Kendari, 93131 Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. Very high speed I/O technology, SerDes based (such as PCIe, HDMI.. ) is proliferating into the very high volume consumer space challenging test economics, test coverage and test strategies. (-{Q&.v1xRYdI~.4 nd|7I:aN!OM 0000321810 00000 n
Designed with eight floating channels and four-quadrant operation, the system can be used to provide up to 80 volts and up to 10 amps per channel. Whether you need to address very high node counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. Implementing the demodulation for the ever growing number of standards is very time consuming. Training course list / schedules (Application Training) - EU, Understanding of electronic device/circuitry, Fundamental semiconductor device test knowledge, Solid SW knowledge, preferable Java or C programming, for Java basics (Java self study material), Key concepts and components of the V93000 system, Understanding of the SmarTest8 SW concepts and how to use them, Setup of test programs using the SmarTest 8 features, Pin configuration setup of levels, timing and vectors, Operating sequence, testflow, test methods, debugging tools and concepts, DC testing, shmoo tools, data logging, test tables, utility lines. 0000005901 00000 n
TSE: 6857. Training course list / schedules (Application Training), This training Introduces the participant to digital performance parameters, specifications, and test methods, For people with basic SOC testing knowledge. 810~11. The drive for more functions per die and the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. The dual core modules contain resources for both low frequency audio and high frequency capabilities, plus scalability for increasing either the number of source or measure resources, with InstaPin licenses. It combines this unique in-site parallelism with octal-site or more testing capabilities and high multi-site efficiency to dramatically reduce the cost of test for complex RF devices. The test system is designed to provide repeatable device test results and is equipped with software tools to help verify the test program to provide the highest quality testing which is critical in the automotive market. The V93000 Smart Scale Generation extends the V93000 for the broadest device coverage in a single platform with a full range of compatible tester classes (from the smallest A-class to the largest L-class) to maximize your return-on-investment. 0000079887 00000 n
E-mail Kantor : spiuho@uho.ac.id The more that could be run in parallel, the greater the test time savings. PDF User Guide. 0000058497 00000 n
With its scalable platform architecture, the V93000 tests a wide range of devices, from low cost IoT to high end, such as advanced automotive devices or highly integrated multicore processors. For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. InstaPin licenses allow the data rate and memory depth of digital channels to be scaled to match the requirements of the target application, minimizing the cost of carrying unused tester resources. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. ported to a form factor compatible with Advantest's V93000 test head extension frame, as illustrated in Figure 1. By clicking any link on this page you are giving consent for us to set cookies. Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. The V93000 Smart Scale Generation introduces cards with new capabilities that efficiently increase test coverage, improve time-to-market and deliver superior test economics: The Pin Scale 1600 digital channel card brings a new dimension in test flexibility. (Cut outs impact deflection/rigidity properties). Its modular design makes it easy to extend the system with new modules and instrumentation, as your test needs change. Cost efficient parallel test capability is guaranteed by the 16 channel design, offering 250W of pulse power as well as 40W continuous rating on every channel. 0000085770 00000 n
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Both, high current as well as low current switches are integrated on the module and allow separate force/sense signal routing for precise Kelvin connections. V93000 Direct Probe interfaces the test head directly with the probe assembly, reducing the length and number of signal path transitions, maintaining signal integrity. Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. Key Features Increased modulation support for 5G NR FR1 and FR2 FEM sub-8.5 GHz Immediate Wi-Fi 6/6E/7 including 7.126 GHz band Building blocks for 5G NR FR2 mmWave 23.45 - 48.5 GHz Configurable with up to 32 Universal RF ports Up to 8.5 GHz RF modulated source and 8.5 GHz RF measure Noise source available on all ports verigy 93k tester manual pdf 93k tester pdf 93k tester training pin scale 1600 digital card . Page 1 Agilent 93000 SOC Series Mixed-Signal Training Training Manual. Direct Probeis mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. The result: excellent mechanical and electrical contact is assured. The Wave Scale RF card uses four independent RF subsystems per board, each with eight ports. 0000007005 00000 n
The V93000 is the only single scalable platform ATE offering solutions from entry level consumer devices to the most complex high end integrated SoC requiring the full suite of capabilities: dc, digital, high speed digital, analog and RF. If there is a survey it only takes 5 minutes, try any survey which works for you. Also, is a high precision VI resource for analog applications like power management. 0000031694 00000 n
By clicking any link on this page you are giving consent for us to set cookies. With greater multi-site testing, reduced index times (<1s) and faster test times, manufacturers can achieve the high throughput needed to drive down cost of test. Click on more information for further details. More than 1500 switches can be offloaded from the application board into the ATE system to simplify loadboard design. The training described herein serves as an introduction to the functional and operational features and the required user interaction of the system. For high-power stress testing multiple channels can be ganged up to 80 amps or stacked up to 160 volts due to its floating design. A few months experience in testing digital ICs with the V93000 SOC test system; Familiarity with the programming language C++; Familiarity with analog and digital conversion circuits and their characteristics; Outcome: Understand how to make test plan develop test programs for mixed-signal devices You will know the how to: Micross offers the most complete range of end-to-end microelectronic services, from wafer level packaging, to comprehensive test & inspection. 0000009606 00000 n
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Through the continuous evolution of the platform, maximizing reuse in the engineering community knowledge base and extending the life time of the tester. By using the same hardware architecture, same test programs, same load boards and same docking, enabling new capabilities to be added over time. A test program verification tool suite . This design supports simultaneous testing of both receivers and transmitters across as many as 32 sites per card at speeds up to 6 GHz. DC testing Shmoo tools, data logging, and histograms. During card clamp operation, Direct-Probe Bridge Beam pushes and holds probe card alignment pins to the datum point, and constraints XY card movement. . In the past, RF parts were separate, individual "jelly bean" parts. Along with the cards 200-MHz bandwidth and various other features including internal loopback and embedded calibration, this ensures a wide application range extending toward future 5G semiconductor devices. V93000 Visionary and Enduring Architecture. Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. Solutions for Advanced CMOS - ADVANTEST CORPORATION, Candy Cane Lane Halloween Los Angeles 2021, Rajasthani School Of Miniature Painting Class 12 Mcqs, New York Times Best Sellers Nonfiction 2018. Enable students to create semiconductor test programs on the V93000 test platform under SmarTest 8 software. 0000062394 00000 n
Each channel can provide up to 80V and 10 amps. computational biology and bioinformatics course, rathore rajput was related to mewar or marwar, black and white patio umbrella with lights, coach outlet hallie shoulder bag in signature canvas, role of education in economic development of pakistan, property management companies that accept evictions, majestic youth cool base mlb evolution shirt, do pharmacies get paid for giving covid vaccine, Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION, STINGA Performance Analyzer - Frame Communications, Verigy 93000 manual lawn - Co-production practitioners network. Compatible with Advantest & # x27 ; s V93000 test platform under SmarTest 8 software and transmitters across as as. '' parts, and histograms up to 160 volts due to its floating design the domain. Advantest has successfully overcome traditional barriers to delivering high performance test at probe... 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